Improved atomic force microscopy cantilever performance by partial reflective coating
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چکیده
منابع مشابه
Improved atomic force microscopy cantilever performance by partial reflective coating
Optical beam deflection systems are widely used in cantilever based atomic force microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the detector side to increase the reflectivity in order to achieve a high signal on the photodiode. Although the reflective coating is usually much thinner than the cantilever, it can still significantly contribute to the damping of th...
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ژورنال
عنوان ژورنال: Beilstein Journal of Nanotechnology
سال: 2015
ISSN: 2190-4286
DOI: 10.3762/bjnano.6.150